SC-FDR2118 Force Displacement Resistance Test System (Test Probe Life & Elastic Resistance & Current Test System) is used to test the probe life cycle, elastic resistance and electric current. The test system consists of testing machine, micro resistance acquisition module, multiple product test bench, XYZ mobile platform, PLC control system and computer software system.
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Scince
Function
1. Probe life cycle test
Using cam structure to circulate disc pressure probe to complete the life cycle test.
Complete resistance measurement during disc pressure interval.
Supportup to 96PIN relay test, test resistance through resistance meter.
Data and curve analysis function.
Provide single PINcurve analysis after multiple disc pressing.
Provides MAP analysis to analyze probe quality.
2. Probe elastic resistance test
XYZ platform tests the corresponding elasticity and resistance.
Unlimited number of probe pins.
Data and curve analysis function.
Provide single PINcurve analysis after multiple disc pressing.
Provides MAP analysis to analyze probe quality.
3. Probe current test
Test current and resistance curves of up to 5 PINs.
Platform Z confirms test origin (load or travel).
The XY platforms move to the corresponding PIN for current and resistance measurements.
Current increases to rated current in standard steps.
Current and resistance sampleat set measurement intervals.
Data and curve analysis function.
Advantages
Controlled by a PC, the device realized human-computer interaction, which is convenient for operators to operate and observe the test situation.
The millisecond time, large density, fast speed and extensive number of data acquisition make the performance much higher than other similar products that rely on manual data collection.
High accuracy, multiple functions.
The software system fully considers the convenience of manual operation to reduce the test error caused by manual operation.
Reports of test result will be automatically generated for easy statistics.
Application
The device is mainly used to test indicators of the test probes, including the life cycle, the elastic resistance (elasticity and impedance), and the relationship between the probe current and resistance.
The product is suitable for product quality control of the test probes manufacturer, and the test probes factory as the means of incoming products inspection.
Main Technical Parameters
Items | Parameters | Explanation |
Load range | 0~500g | |
Load precision | 0.2% | |
Z-axis | 100mm | |
Z-axis precision | 0.005 | |
X-axis | 160mm | |
X-axis precision | 0.01 | |
Y-axis | 60mm | |
Y-axis precision | 0.01 | |
Life test PIN | 32PIN | Can be extended to96PIN |
Max test current | 10A | |
Max speed of CAM disc pressure | 300rpm | |
32 relay speeds | 45s | |
Elastic resistance test speed（36PIN） | 16min | Test conditions: press 0.35mm, stroke origin mode. First preload, check the origin each time |
Elastic resistance test speed（36PIN） | 20min | Test conditions: press 0.35mm, stroke origin mode. Check the origin eachpreload |
Dimensions | 888mm*530mm*490mm | Computer size is not included |
Power supply | AC220V，50Hz | |
Power | 500W |
Function
1. Probe life cycle test
Using cam structure to circulate disc pressure probe to complete the life cycle test.
Complete resistance measurement during disc pressure interval.
Supportup to 96PIN relay test, test resistance through resistance meter.
Data and curve analysis function.
Provide single PINcurve analysis after multiple disc pressing.
Provides MAP analysis to analyze probe quality.
2. Probe elastic resistance test
XYZ platform tests the corresponding elasticity and resistance.
Unlimited number of probe pins.
Data and curve analysis function.
Provide single PINcurve analysis after multiple disc pressing.
Provides MAP analysis to analyze probe quality.
3. Probe current test
Test current and resistance curves of up to 5 PINs.
Platform Z confirms test origin (load or travel).
The XY platforms move to the corresponding PIN for current and resistance measurements.
Current increases to rated current in standard steps.
Current and resistance sampleat set measurement intervals.
Data and curve analysis function.
Advantages
Controlled by a PC, the device realized human-computer interaction, which is convenient for operators to operate and observe the test situation.
The millisecond time, large density, fast speed and extensive number of data acquisition make the performance much higher than other similar products that rely on manual data collection.
High accuracy, multiple functions.
The software system fully considers the convenience of manual operation to reduce the test error caused by manual operation.
Reports of test result will be automatically generated for easy statistics.
Application
The device is mainly used to test indicators of the test probes, including the life cycle, the elastic resistance (elasticity and impedance), and the relationship between the probe current and resistance.
The product is suitable for product quality control of the test probes manufacturer, and the test probes factory as the means of incoming products inspection.
Main Technical Parameters
Items | Parameters | Explanation |
Load range | 0~500g | |
Load precision | 0.2% | |
Z-axis | 100mm | |
Z-axis precision | 0.005 | |
X-axis | 160mm | |
X-axis precision | 0.01 | |
Y-axis | 60mm | |
Y-axis precision | 0.01 | |
Life test PIN | 32PIN | Can be extended to96PIN |
Max test current | 10A | |
Max speed of CAM disc pressure | 300rpm | |
32 relay speeds | 45s | |
Elastic resistance test speed（36PIN） | 16min | Test conditions: press 0.35mm, stroke origin mode. First preload, check the origin each time |
Elastic resistance test speed（36PIN） | 20min | Test conditions: press 0.35mm, stroke origin mode. Check the origin eachpreload |
Dimensions | 888mm*530mm*490mm | Computer size is not included |
Power supply | AC220V，50Hz | |
Power | 500W |
